Abstract:
In this paper the effect of substrate temperature on electrical and morphological
properties of CuAlS2 thin films prepared by two stage vacuum thermal evaporation technique
have been studied. The electrical resistivity of the films was studied using four point probe
method. The surface morphology was examined by employing Evoma-10 Scanning electron
Microscope. The resistivity ( ) of CuAlS2 film is found to decrease with increase in
substrate temperature, which is related to the increase of carrier concentration with increase
in substrate temperature. Thus films grown at an elevated substrate temperatures exhibit the
lowest resistivity and high carrier concentration, implying that these are the most conductive
films. Low electrical resistivity and high carrier concentration are widely used as the
essential components in various optoelectronic devices and photovoltaic cells. Visual
inspection of Scanning electron microscopy (SEM) micrographs of the films showed that
crystallite size increase with increase insubstrate temperature
